The Hitachi HF5000 200kV (S)TEM has the unique advantage of combining atomic resolution imaging with elemental analysis at the atomic level. This allows for a more detailed understanding of the structure and composition of materials, making it a valuable tool for materials research. The high-energy electrons used in this instrument provide high resolution, allowing for the visualization of individual atoms and their interactions. Additionally, the ability to perform elemental analysis at the atomic level allows for a more in-depth understanding of the chemical makeup of materials. Overall, the Hitachi HF5000 200kV (S)TEM is a powerful tool for characterizing the microstructure and chemical composition of materials.
It has cold FEG and automated probe-forming spherical aberration corrector.
It has Oxford Instruments dual SDD dedectors for EDX analysis and
Gatan Quantum Imaging Filter (GIF) for electron energy-loss spectroscopy (EELS) analysis.
It has simultaneous SEM & STEM imaging capability.
High-brightness and high-stability cold FE electron gun (Cold FEG)
0.078 nm spatial resolution in STEM
Cs-corrected SEM & STEM imaging capability
Hitachi’s own fully automated aberration corrector
Oxford Instruments symmetrically opposed dual 100 mm2 EDX detectors
Gatan Quantum Imaging Filter (GIF) for electron energy-loss spectroscopy (EELS) analysis