The Fourier Transform Infrared (FT-IR) Spectrometer and Microscope System combines microscopy and spectroscopy into a single instrument.
Fourier Transform Infrared Spectrometer and Microscope System uses a scan mirror to move the incident light to specified point, it rapidly collects a full spectrum at each position without moving the sample stage.
High optical throughput using high quality reflective components
Wave number measurement range 6000 to 400 cm-1
Single reflection diamond ATR
Spectra Manager™ Suite data processing software